Standard TCM Array Probes

Versatile Eddy Current Array Probes for Efficient Surface Inspection

Large-area testing with position accuracy. The array probes extend the TCM platform with powerful Eddy Current Array (ECA) technology for efficient inspection of surfaces and near-surface areas. By combining multiple sensor elements in compact probe designs, large inspection areas can be covered quickly and efficiently while providing precise positional mapping of inspection data.

The portfolio spans a wide range of probe characteristics – from highly flexible array probes that adapt to complex geometries and very small radii, to semi-flexible designs for demanding inspection geometries, and low-frequency variants optimized for residual wall thickness measurement.

Direction-independent defect detection is available across the range, enabling reliable crack detection regardless of defect orientation.

For applications requiring exceptionally high spatial resolution, a dedicated High-Resolution Array Probe is available, enabling highly precise detection of the smallest surface defects in critical inspection areas.

When used in combination with the TCM platform, array probes benefit from intuitive app-based operation, automatic probe recognition, and seamless integration into digital inspection workflows.

Product highlights

Your advantages at a glance

  • One array probe portfolio – wide application range: Flexible, semi-flexible, high-resolution, and low-frequency probes for crack detection and residual wall thickness testing.
  • Direction-independent defect detection: Reliable results regardless of defect orientation.
  • The right balance of flexibility and resolution: Optimized probe designs for different geometries, frequencies, and sensitivity requirements.
  • Efficient large-area inspection: Fast coverage combined with high spatial resolution and precise position assignment.
  • Seamless TCM integration: Automatic probe recognition, intuitive app-based operation, and full C-scan documentation (PNG / PDF / CSV).

Technical information for Standard Array Probes

Frequency range: 0.1 – 3 MHz | 10 – 1000 kHz | 0.5 – 30 kHz
Probe track width:

2.2 mm | 1.4 mm | 4.6 mm
Array inspection length: 140 mm | 89 mm | 110 mm
Number of elements (standard configuration*):

64 | 64 | 24

*Customized array probe solutions with up to 512 parallel elements, as well as application-specific shapes and lengths, are available on request.

Related products

ECA TCM

Eddy current testing with sensor arrays for large-area inspection

High-Resolution Array Probe

High-resolution Eddy Current Array probe for the precise detection and localization of the smallest surface defects

TCM Standard Probes

Flexible probe solutions for precise eddy current inspection with the TCM