STATOVISION

High-Resolution C-Scan Visualization for STATOGRAPH CM

Innovative visualization of eddy current signals for component testing. STATOVISION CM transforms eddy current inspection data into high-resolution C-scans and makes surface quality visible at a glance. In combination with STATOGRAPH CM or STATOGRAPH CM+, the software provides an intuitive visualization of inspection data, enabling precise localization and evaluation of surface defects.

A key advantage of STATOVISION CM is its intelligent pattern recognition. Recurring geometries and interfering contours such as drill holes, grooves, bevels or milled features can be automatically identified and selectively suppressed. This enables reliable detection of cracks and other surface defects even in areas that were previously difficult or impossible to inspect.

The high-resolution C-scan representation simplifies the interpretation of complex eddy current signals and provides a detailed image of the inspected component surface. Inspection data can be stored for complete traceability, statistical analysis and continuous quality assurance.

By comparing and overlaying inspection results from multiple components, recurring defect patterns can be identified at an early stage. This helps detect process deviations such as tool wear, supports process optimization and contributes to reducing scrap rates.

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