High-Resolution Array Probe
High-resolution Eddy Current Array probe for the precise detection and localization of the smallest surface defects
Finest Defects. Maximum Resolution. The High Resolution Array Probe expands the mobile eddy current device TCM with a powerful solution for applications that demand maximum resolution and precise defect localization. Featuring 64 sensor elements with a track width of just 0.6 mm, the probe delivers highly detailed inspection data and reliably reveals even the smallest surface defects.
The probe is particularly suited for inspections of borehole areas and other localized inspection zones where maximum spatial resolution is required. Its high-resolution sensor design enables precise evaluation of indications and supports the detection of defects that are difficult to identify using conventional array solutions. At the same time, the large scan width ensures efficient inspection of larger surface areas.
An integrated optical encoder provides accurate position tracking of inspection data and operates reliably on a wide variety of surfaces – from matte and dark to glossy finishes. In addition, the probe offers omnidirectional defect detection, allowing cracks and other defects to be identified regardless of their orientation.
Combined with the TCM ECA App, users benefit from automatic probe recognition, intuitive operation and comprehensive digital C-scan documentation. The result is a powerful and mobile inspection solution for demanding Eddy Current Array applications.
