CIRCOGRAPH DI

Compact inline eddy current inspection with centralized control for longitudinal surface defects

Reliable surface inspection with maximum flexibility. The CIRCOGRAPH DI is a compact eddy current inspection system for the non-destructive detection of longitudinal surface defects on bright products such as tubes, bars and wire. Designed for production lines with moderate inspection speeds, it delivers the same reliable inspection performance as the CIRCOGRAPH CI while enabling centralized operation through an external control computer.

Operation, parameter configuration, result visualization and data archiving are performed via an Ethernet-connected PC. This separation of inspection and operation allows the testing electronics to be installed close to the production line while providing convenient control and quality monitoring from a central workstation.

Equipped with two inspection channels, continuously adjustable test frequencies from 30 kHz to 1 MHz and a wide range of rotating sensor heads, the CIRCOGRAPH DI adapts to a variety of applications and product dimensions. Surface-breaking longitudinal defects from approximately 30 μm are detected reliably and contactlessly, while the compact design enables seamless integration into existing production environments.

Product highlights

Applications

Eddy Current Testing

Eddy Current Testing

Crack Inspection

Crack Inspection

Technical information

Test material: ferromagnetic, austenitic, and non-ferromagnetic materials
Sensor system: Rotating sensor system with a maximum of two opposite test heads (Ro 20 and Ro 35)
Excitation frequencies: 30 kHz – 1 MHz
Max. throughput: 3 m/s during continuous testing
Defect display: from 30 µm at Ro 20 / Ro 35

Accessories

Test defect saw

Precision sawing of artificial test errors for calibration

CIRCOGRAPH High-Speed Rotating Heads

High-throughput rotating sensor systems for contactless eddy current inspection

CIRCOGRAPH sensor systems

Rotating sensor systems for maximum detection sensitivity