CIRCOGRAPH CI

Compact inline eddy current inspection for longitudinal surface defects on bright products

Compact, intuitive and reliable surface inspection. The CIRCOGRAPH CI is a compact eddy current inspection system for the non-destructive detection of longitudinal surface defects on bright products such as tubes, bars and wire. Designed for production lines with moderate inspection speeds, it combines reliable defect detection with intuitive operation in a compact, space-saving system.

Equipped with two inspection channels, continuously adjustable test frequencies from 30 kHz to 1 MHz and a wide range of rotating sensor heads, the CIRCOGRAPH CI can be adapted to a variety of applications and product dimensions. Surface-breaking defects from approximately 30 μm can be detected reliably and contactlessly.

The integrated operator interface with Turn & Push control enables fast setup and simple operation directly at the instrument. Ethernet connectivity and configurable I/O interfaces allow seamless integration into existing production lines while supporting quality documentation and data exchange with higher-level systems.

Product highlights

Applications

Eddy Current Testing

Eddy Current Testing

Crack Inspection

Crack Inspection

Technical information

Test material: Ferromagnetic, austenitic, and non-ferromagnetic material
Sensor system: Rotating sensor system with a maximum of two (Ro 20 and Ro 35) opposite test heads
Excitation frequencies: 30 kHz – 1 MHz
Max. throughput: 3 m/s during continuous testing
Defect display: from 30 µm at Ro 20 / Ro 35

Accessories

Test defect saw

Precision sawing of artificial test errors for calibration

CIRCOGRAPH High-Speed Rotating Heads

High-throughput rotating sensor systems for contactless eddy current inspection

CIRCOGRAPH sensor systems

Rotating sensor systems for maximum detection sensitivity

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