Array Probes for TCM
High-resolution eddy current testing across a wide range of applications
Large-area testing with position accuracy. The array probes extend the TCM platform with powerful Eddy Current Array (ECA) technology for efficient inspection of surfaces and near-surface areas. By combining multiple sensor elements in compact probe designs, large inspection areas can be covered quickly while maintaining high spatial resolution.
The portfolio spans a wide range of probe characteristics — from highly flexible array probes that adapt to complex geometries and very small radii, to semi-flexible designs offering increased spatial resolution, and low-frequency variants optimized for residual wall thickness measurement.
Direction-independent defect detection is available across the range, enabling reliable crack detection regardless of defect orientation. High-resolution configurations are available for applications requiring maximum sensitivity and precise defect localization, such as inspections around boreholes or other critical areas.
When used in combination with the TCM platform, array probes benefit from intuitive app-based operation, automatic probe recognition, and seamless integration into digital inspection workflows.
Product highlights
Technical information for Standard Array Probes
| Frequency range: | 0,1–3 MHz | 10–1000 kHz | 0,5–30 kHz |
| Probe track width: |
2,2 mm | 1,4 mm | 4,6 mm |
| Array inspection length: | 140 mm | 89 mm | 110 mm |
| Number of elements (standard configuration*): |
64 | 64 | 24 |
*Customized array probe solutions with up to 512 parallel elements, as well as application-specific shapes and lengths, are available on request.
Related products
