Non-Destructive Eddy Current Testing of Components
The STATOGRAPH family of test instruments permits non-destructive eddy current testing for flaws (cracks, pores, shrinkholes, etc.) close to the surfaces of metallic components and small parts. From the economical eddy current module for Yes/No test decisions through to the multi-channel systems with comprehensive signal evaluation and statistical documentation, the STATOGRAPH group of instruments offers all possibilities for the integration of automatic testing equipment in customer- specific production processes.
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STATOGRAPH ECM 6.421
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STATOGRAPH ECM 6.421
The module for eddy current testing with scanning probes or rotating probes. Simplest operating controls, unidimensional signal display, Yes/No sorting. Problem-free integration in existing control cabinets, galvanically decoupled interface to the test line controller (PLC). The STATOGRAPH ECM is exceptionally well-suited for integration in complex systems which - with or without PC control - perform their test functions in single-channel or multichannel applications.
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STATOGRAPH CS 6.425
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STATOGRAPH CS 6.425
The compact instrument for eddy current flaw testing for single-channel or dual-channel applications. Processor-controlled test instruments for fully-automatic surface flaw testing. Optionally equipped with a clearance channel which corrects the sensitivity of the test channel appropriately with changes in the probe clearance to the part surface. Archiving of instrument settings on an internal archive and on a memory card. Documentation of the test results. Computer interface to control systems.
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STATOGRAPH S 6.420
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STATOGRAPH S 6.420
The high-end instrument for eddy current testing with up to 16 test stations and up to 64 test channels. Greatest possible flexibility in its configuration and connections for different sensor systems. Built into 19" cabinets suitable for industrial use, with or without active air conditioning, depending on the requirements.
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STATOGRAPH Sensor systems
For surface flaw testing on components, so-called scanning probes are used as sensors. The user has a wide variety of models, adapted to all imaginable specimen geometries. The part surface to be tested is examined by one or more eddy current probes. In general, the test specimen is put into rotation through a suitable handling mechanism and scanned with a probe which is fixed or moves linerally. As an alternative to this, a rotating probe which tests the part in a fixed position can be used. Because of the importance of the sensor system, attention is placed on precise manufacturing and continuous further development of test probes at FOERSTER.
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FOERSTER Standard Scanning Probes
For almost every application, we can offer you the right scanning probe. Different models (straight, angled), different probe track and working widths as well as frequency ranges adapted to the test requirements permit the user to select the optimum probe system for his application. We can also fulfil special wishes beyond the range of our extensive program of standard probes: Our Magnetic test systems subsidiary has specialized in the development and manufacturing of customer-specific probes and coils.
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Rotating probe 6.481
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Rotating Probe 6.481
Many applications can be implemented more economically if the probe is rotated instead of the complicated mechanics to manipulate the test pieces. Such applications can be realized especially well with the FOERSTER rotating probes of the 6.481 type series. For the testing of borings and radii, the Type R rotating probes with radially-arranged probe elements are available. Flat surfaces are tested using Type T rotating probes with probe elements located on the front face.
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Circoscan H
FOERSTER offers the Circoscan H to handle applications in which larger diameters of the rotating probe (for example, cylinder borings) or special probe elements adapted to the dimensions and contours of the components (for example, disk testing) are required. The specific probes for these components can be connected to an adapter and changed quickly as required.
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